Reliability and Remaining Useful Life (RUL) Assessment

As electronics degrade over their lifetime, they become more susceptible to performance reduction, faults, and inevitable failure. Component exposure to environmental and operational risk factors, inevitably result in high failure rates and unexpected maintenance costs. The failure of electronic components and systems have disastrous consequences for companies and their clients. Failures can be avoided with device measurement technology that can quickly determine the device’s Remaining Useful Life (RUL). By using sophisticated tools such as ADEC and SAS Nokomis is able to provide a Reliability and Remaining Useful Life Assessment. Save time and money by having a RUL Assessment of all critical systems, preventing unexpected failures and warranty costs.