Advanced Diagnostics of Electronic Components (ADEC)
Nokomis’ Advanced Diagnostics of Electronic Components (ADEC) system is a non-invasive instrument that detects substandard electronic piece parts, populated circuit boards, and fully integrated electronic devices within seconds. ADEC exploits subtle, yet distinctly characteristic fingerprint-like unintended Radio Frequency (RF) emissions to detect anomalous electronics. Each of the four channels acts independently, facilitating the ability to analyze signature indicators simultaneously in different spectral regions. In addition to a baseline sensitivity of -170 dBm, the four-channel system’s enablement of simultaneous assessment of emissions data in multiple frequency regions provides a powerful breakthrough in the battle against counterfeits and cyber-physical threats.
The ADEC system consists of two primary components: The ADEC Sensor and the Integrated Antenna Enclosure (IAE). Each delivered system includes the ADEC Sensor, IAE, Cables and Connectors, all other peripherals necessary for operation and a User’s Manual.
ADEC Applications
- The Signature Analysis Suite (SAS)
- Broadband Data Acquisition (DAQ)
- Counterfeit Detection
- Firmware and Software Integrity Verification
- Detection of Maliciously Modified Electronics
- Detection of Cyber Attacks
- Physical Cyber Security
ADEC Features
- Simple User Interface
- Rapid Scanning
- Customizable Signature Database for Electronic Components
ADEC Smart Phone Test
ADEC Piece Part Test
Real-time non-invasive ADEC system detects counterfeit electronics within seconds.
ADEC System includes:
- One (1) ADEC System
- One (1) Integrated Antenna Enclosure
- Cables and Connectors
Basic System Features and Components
Signature Analyzer
The heart of the ADEC system is the Signature Analyzer. The Signature Analyzer is an ultra-sensitive high-throughput analytical capability that provides high performance counterfeit detection. All functions are accessed through the integrated touchscreen monitor or via plug-in mouse or keyboard. The unit also supplies all manufacturer’s specified Input/Output (I/O) including power, ground, and clock to parts being tested. The Signature Analyzer controls the testing process and provides automated results for each sample tested. The Signature Analyzer can also be operated in manual mode to collect part signature data directly. The Signature Analyzer includes all connective and power cabling required to operate the ADEC system.
Integrated Antenna Enclosure (IAE)
The ADEC Integrated Antenna Enclosure (IAE) is a bench top test chamber specifically designed for collecting extremely low power Radio Frequency (RF) energy over a wide frequency range. The unique shape of the IAE allows for maximum reception of emanating RF energy from Integrated Circuits (ICs) and/or populated Printed Circuit Boards (PCBs). Test fixtures are mounted via a drawer-like access panel at the base of the unit. I/Os necessary to power the electronics being tested are ported through an access panel that provides maximum signal integrity to the device under test (DUT). The collection antenna is integrated into the IAE. During testing measured spectral data is automatically ported back into the analyzer from the IAE.
Optional Software
ADEC Signature Analysis Suite (SAS)
The ADEC Signature Analysis Suite (SAS) is an offline assessment tool that allows the user to view and analyze data from the ADEC system in an emulated environment to support custom analyses and algorithm parameter optimization. This tool allows the user to make detailed assessments of signatures from multiple parts simultaneously, which facilitates efficient assessment of signature variations caused by counterfeiting, part cloning, program modifications or IC tamper. The Signature Analysis Suite provides unique analytical and informatic tools for detailed signature analysis. The ADEC Signature Analysis Suite is fully compatible with all data collected from the four channel ADEC system.
Hiawatha Spectrum Analyzer (HSA)
The HSA is a highly-sensitive multi-channel spectrum analysis tool that allows the user to perform assessments of emissions signature data over multiple frequency ranges simultaneously. The operator can control each channel individually, selecting frequency, span, and Resolution Bandwidth (RBW) to focus on regions of interest to a particular part. The HSA is ideal for evaluating time-varying behavior of signatures, as well as for observing signatures that may exhibit variance in response to an external stimulus or modification of part configuration. The HSA takes full advantage of the Hiawatha’s high sensitivity, which is better than -170 dBm at room temperature and 1 Hz resolution. This allows the user to analyze low level signatures that cannot otherwise be observed using COTS spectrum analyzers. The HSA is a software upgradable option for the standard four channel ADEC system.
Broadband Data Acquisition System
The Broadband Data Acquisition System is a wideband spectrum data capture tool that allows the user to rapidly acquire high-acuity spectral data over the entire spectral range from 30 MHz to 3 GHz. The user can specify acquisition frequency resolution and acquisition time as well as other data processing parameters. Acquired bandwidth can be continuous and complete or specified to capture signature data in frequency regions of interest for a particular part. The ADEC Signature Analysis Suite can be used to manually or automatically analyze data acquired using this system. The Broadband Data Acquisition System is fully compatible with the standard four channel ADEC system.
Four-Channel ADEC System
ADEC SYSTEM SPECIFICATIONS
Operating Environment | Desktop / Benchtop |
Operating System | Microsoft Windows |
Part Library | Software Updateable |
Power Requirements | 110 VAC |
Component Scan Time | < 5 sec |
Frequency Range | 30 MHz through 3 GHz |
IAE SPECIFICATIONS
Enclosure Size | 13.5 in x 29.6 in x 16.24 in |
Enclosure Door Size | 7 in (W) x 5 in (H) |
Door Operation | Manual |
Enclosure Weight | 59 lbs |
Shielding Effectiveness | > 80 db |
Cables and Connectors | Provided |